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Volumn 33, Issue 6, 2006, Pages 2001-
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SU‐FF‐I‐22: Analysis of Residual Geometric Artifacts From 4DCT
a b c a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33847179363
PISSN: 00942405
EISSN: None
Source Type: Journal
DOI: 10.1118/1.2240261 Document Type: Conference Paper |
Times cited : (2)
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References (0)
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