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Volumn 2005, Issue , 2005, Pages 2251-2253
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Measurement of the secondary emission yield of a thin diamond window in transmission mode
a a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DIAMONDS;
ELECTRIC FIELDS;
HYDROGEN;
PARTICLE BEAM INJECTION;
ELECTRON YIELD;
SECONDARY EMISSION ENHANCED PHOTOINJECTOR (SEEP);
ELECTRON BEAMS;
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EID: 33847173397
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PAC.2005.1591073 Document Type: Conference Paper |
Times cited : (7)
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References (1)
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