A leakage control system for thermal stability during burn-in test

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 982-991

  Meterelliyoz, Mesut ^a   Mahmoodi, Hamid ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; FEEDBACK; LEAKAGE CURRENTS; THERMODYNAMIC STABILITY;

BURN-IN TESTS; LEAKAGE CONTROL SYSTEM; YIELD LOSS;

INTEGRATED CIRCUIT TESTING;

EID: 33847166551     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584064     Document Type: Conference Paper

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