Application of trend analysis methodologies on Built-in-Test (BIT) (and non-BIT) systems in a operational U.S. navy fighter/attack squadron

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2005, Pages 1836-1841

  Woell, Jeffrey J ^a  

^a NAVAL AIR SYSTEMS COMMAND   (United States)

Author keywords

Built In Text (BIT); NAVAL maintenance; Trend analysis

Indexed keywords

ATTACK SQUADRON; BUILT-IN-TEST (BIT) SYSTEM; NAVAL MAINTENANCE; TREND ANALYSIS;

ERROR CORRECTION; FIGHTER AIRCRAFT; HIGH PRESSURE EFFECTS; NAVAL WARFARE; PREVENTIVE MAINTENANCE;

MECHANICAL TESTING;

EID: 33847162455     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)