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Volumn 2, Issue , 2005, Pages 926-929
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Characterization of bonded wafer for RF filters with reduced TCF
a a a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
LITHIUM TANTALATE;
SAW DUPLEXERS;
SKIRT STEEPNESS;
ACOUSTIC SURFACE WAVE DEVICES;
INSERTION LOSSES;
LITHIUM COMPOUNDS;
NATURAL FREQUENCIES;
RESONATORS;
WAVE FILTERS;
SILICON WAFERS;
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EID: 33847160723
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ULTSYM.2005.1603002 Document Type: Conference Paper |
Times cited : (12)
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References (10)
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