Microwave reflectometry as a novel diagnostic method for detection of skin cancers

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2005, Pages 1425-1428

  Chand, K ^a   Mehta, P ^a   Beetner, D G ^a   Zoughi, R ^a   Stoecker, W V ^b  

^a University of Missouri Rolla   (United States)

^b The Dermatology Center   (United States)

Author keywords

Basal cell carcinoma; Melanoma; Micro wave reflectometry; Relaxation frequency

Indexed keywords

BASAL CELL CARCINOMA; MELANOMA; MICROWAVE REFLECTOMETRY; RELAXATION FREQUENCY;

DISEASES; ONCOLOGY; PATIENT MONITORING; REFLECTOMETERS; SKIN;

MICROWAVE MEASUREMENT;

EID: 33847158258     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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