Residual-gas-ionization beam profile monitors in RHIC

Proceedings of the IEEE Particle Accelerator Conference

Volumn 2005, Issue , 2005, Pages 230-234

  Connolly, R ^a   Michnoff, R ^a   Tepikian, S ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; ELECTRON EMISSION; GROWTH (MATERIALS); IONIZATION; RATE CONSTANTS;

EMITTANCE; IONIZATION PROFILE MONITORS; MONITOR MICROCHANNEL PLATE (MCP); QUADRUPOLE OSCILLATIONS;

PARTICLE BEAMS;

EID: 33847122543     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PAC.2005.1590402     Document Type: Conference Paper

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