Influence of strain on the atomic and electronic structure of manganite films

Journal of Physics and Chemistry of Solids

Volumn 68, Issue 3, 2007, Pages 458-463

  Qian, Q ^a   Tyson, T A ^a   Deleon, M ^a   Kao, C C ^b   Bai, J ^c   Frenkel, A I ^d  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d YESHIVA UNIVERSITY   (United States)

Author keywords

C. XRD

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRONIC STRUCTURE; MANGANESE COMPOUNDS; STRAIN; SUBSTRATES; X RAY DIFFRACTION;

MN O MN BOND ANGLES; SPIN POLARIZED MEASUREMENTS; SPLITTING; TWO LAYER MODELS;

THICK FILMS;

EID: 33847101908     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.12.024     Document Type: Article

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