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Volumn 75, Issue 8, 2007, Pages

Enhanced photoemission from localized inhomogeneities on Cu(001) characterized by laser-assisted photoemission electron microscopy and low-energy electron microscopy

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EID: 33847101841     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.085430     Document Type: Article
Times cited : (8)

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