Study of secondary emission enhanced photoinjector

Proceedings of the IEEE Particle Accelerator Conference

Volumn 2005, Issue , 2005, Pages 2711-2713

  Chang, Xiangyun ^a   Ben Zvi, Ilan ^a   Burrill, Andrew ^a   Johnson, Peter ^a   Kewisch, Jorg ^a   Rao, Triveni ^a   Segalov, Zvi ^a   Zhao, Yongxiang ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; HIGH ENERGY PHYSICS; PARTICLE BEAM INJECTION; TEMPERATURE DISTRIBUTION;

DIAMOND WINDOW; NEGATIVE ELECTRON AFFINITY (NEA); SECONDARY ELECTRON YIELD (SEY); SECONDARY EMISSION ENHANCED PHOTOINJECTOR (SEEP);

SECONDARY EMISSION;

EID: 33847101098     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PAC.2005.1591239     Document Type: Conference Paper

References (6)

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