Femtosecond electron diffraction and its application for beam characterization at the PAL

Proceedings of the IEEE Particle Accelerator Conference

Volumn 2005, Issue , 2005, Pages 3721-3723

  Dao, Xiang ^a   Park, Sung Ju ^b   Ko, In Soo ^b   Wang, X J ^c   Ihee, H ^d  

^a TSINGHUA UNIVERSITY   (China)

^b POSTECH   (South Korea)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d Department of Chemistry   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ELECTRON BEAMS; ELECTRON GUNS; PARTICLE ACCELERATORS; PHOTOCATHODES;

BEAM DIVERGENCE; ELECTRON BEAM EMITTANCE CHARACTERIZATION; FEMTOSECOND ELECTRON DIFFRACTION (FED); RICHARDSON-LUCY ALGORITHM;

ELECTRON DIFFRACTION;

EID: 33847100138     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PAC.2005.1591594     Document Type: Conference Paper

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