Achieving robust designs through quality engineering: Taguchi method

Fujitsu Scientific and Technical Journal

Volumn 43, Issue 1, 2007, Pages 105-112

  Takeshita, Shuji ^a,b,c   Hosokawa, Tetsuo ^a,c  

^a FUJITSU LABORATORIES LTD   (Japan)

^b Institute of Electronics   (Japan)

^c Quality Engineering Society

Author keywords

[No Author keywords available]

Indexed keywords

ERROR FACTORS; GENERIC FUNCTIONS; QUALITY ENGINEERING; TAGUCHI METHOD;

COMPUTER SIMULATION; MACHINE DESIGN; MARKETING; PRODUCT DEVELOPMENT; QUALITY ASSURANCE; ROBUSTNESS (CONTROL SYSTEMS);

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 33847073701     PISSN: 00162523     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (7)

1. The American Supplier Institute: What are Taguchi Methods? http://www.amsup.com/taguchi_methods /index.htm
2. Quality Engineering Society. http://www.qes.gr.jp/english/index.htm
3. N. Kobayashi: NIKKEI Biztech No.007. (in Japanese), Nikkei BP, 2005, p.84-95.
4. H. Sakai et al.: Computer-Aided Optimization System (CAOS) for Optimal Designing of Electronic Equipment, (in Japanese), FUJITSU, 51, 5, p.275-279 (2000). http://img.jp.fujitsu.com/downloads/jp/jmag /vol51-5/paper04.pdf
5. T. Kutsuzawa et al.: Magnetic Recording Head Development using Standard SN-ratio. (in Japanese), Quality Engineering Society, QES2005, 2005, p.66-69.
6. T. Hosokawa et al.: Development of Adhesive for Optical Recording Head, (in Japanese), Quality Engineering Society, QES2005, 2005, p.254-257.
7. H. Kubo et al.: Software Quality Assurance at Fujitsu, (in Japanese), JUCE Press, Ltd., 1989, p.458-460.