High reliability and performance poly-Si TFTs for system in displays

ECS Transactions

Volumn 3, Issue 8, 2006, Pages 35-41

  Hatano, M ^a   Hamamura, H ^a   Matsumura, M ^a   Toyota, Y ^a   Tai, M ^a   Ohkura, M ^a   Miyazawa, T ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATORS; ELECTRIC POTENTIAL; GATES (TRANSISTOR); LASER APPLICATIONS; LIQUID CRYSTAL DISPLAYS;

DYNAMIC STRESS; GATE INSULATOR; LASER CRYSTALLIZATION TECHNOLOGY; VOLTAGE CIRCUITS;

THIN FILM TRANSISTORS;

EID: 33846993747     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2356332     Document Type: Conference Paper

References (9)

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2. M. Tai et al., IEEE Trans. Electro. Dev., 51, p934 (2004).
3. M. Ohkura et al., SID02 Tech Dig., p 146 (2002).
4. T. Miyazawa et al., SID05 Tech. Dig., p 1050(2005).
5. Y. Uraoka et al., IEEE Trans. Electron Devices, vol. 51, p 28 (2004).
6. Y. Toyota et al., IEEE Trans. Electron Devices, vol. 51, p 927 (2004).
7. S. K. Lai, J. Appl. Phys., vol. 54, p 2540 (1983).
8. T.Itoga et al., IDW'01 Tech. Dig., p.1733 (2001).
9. H. Hamamura et al., IDW'06 Tech. Dig., p 987 (2005).