-
1
-
-
37049096497
-
-
Addison, A. W., Rao, T. N., Reedijk, J., van Rijn, J. W. & Verschoor, G. C. (1984). J. Chem. Soc. Dalton Trans. pp. 1349-1355.
-
(1984)
J. Chem. Soc. Dalton Trans
, pp. 1349-1355
-
-
Addison, A.W.1
Rao, T.N.2
Reedijk, J.3
van Rijn, J.W.4
Verschoor, G.C.5
-
4
-
-
33645463793
-
-
In Chinese
-
Fan, C., Ma, C.-B., Hu, M.-Q., Chen, C.-N. & Liu, Q.-T. (2006). Jiegou Huaxue (Chin. J. Struct. Chem.), 25, 285-289. (In Chinese.)
-
(2006)
Jiegou Huaxue (Chin. J. Struct. Chem.)
, vol.25
, pp. 285-289
-
-
Fan, C.1
Ma, C.-B.2
Hu, M.-Q.3
Chen, C.-N.4
Liu, Q.-T.5
-
5
-
-
18544381537
-
-
Kataev, V. A., Spirikhin, L. V., Khaliullin, A. N. & Gailyunas, I. A. (2002). Russ. J. Org. Chem. 38, 1057-1059.
-
(2002)
Russ. J. Org. Chem
, vol.38
, pp. 1057-1059
-
-
Kataev, V.A.1
Spirikhin, L.V.2
Khaliullin, A.N.3
Gailyunas, I.A.4
-
6
-
-
33744498094
-
-
Macrae, C. F., Edgington, P. R., McCabe, P., Pidcock, E., Shields, G. P., Taylor, R., Towler, M. & van de Streek, J. (2006). J. Appl. Cryst. 39, 453-457.
-
(2006)
J. Appl. Cryst
, vol.39
, pp. 453-457
-
-
Macrae, C.F.1
Edgington, P.R.2
McCabe, P.3
Pidcock, E.4
Shields, G.P.5
Taylor, R.6
Towler, M.7
van de Streek, J.8
-
7
-
-
84980089549
-
-
North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.
-
(1968)
Acta Cryst. A
, vol.24
, pp. 351-359
-
-
North, A.C.T.1
Phillips, D.C.2
Mathews, F.S.3
-
9
-
-
0004150157
-
-
Siemens Analytical X-ray Instruments Inc, Madison, Wisconsin, USA
-
Sheldrick, G. M. (1990). SHELXTL/PC. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1990)
SHELXTL/PC
-
-
Sheldrick, G.M.1
-
10
-
-
0004150157
-
-
University of Göttingen, Germany
-
Sheldrick, G. M. (1997). SHELXS97. University of Göttingen, Germany.
-
(1997)
SHELXS97
-
-
Sheldrick, G.M.1
-
11
-
-
33846993137
-
-
Sheldrick, G. M, 2001, SHELXTL. Version 6.12. Bruker AXS Inc, Madison, Wisconsin, USA
-
Sheldrick, G. M. (2001). SHELXTL. Version 6.12. Bruker AXS Inc., Madison, Wisconsin, USA.
-
-
-
-
12
-
-
0003686072
-
-
Siemens Analytical X-ray Instruments Inc, Karlsruhe, Germany
-
Siemens (1989). P3 Software. Siemens Analytical X-ray Instruments Inc., Karlsruhe, Germany.
-
(1989)
P3 Software
-
-
Siemens1
-
14
-
-
0037111478
-
-
Sieroń, L., Bukowska-Strzyżewska, M., Korabik, M. & Mroziński, J. (2002). Polyhedron, 21, 2473-2479.
-
(2002)
Polyhedron
, vol.21
, pp. 2473-2479
-
-
Sieroń, L.1
Bukowska-Strzyżewska, M.2
Korabik, M.3
Mroziński, J.4
-
16
-
-
0037135994
-
-
Valdez, J., Cedillo, R., Campos, A. H., Yepez, L., Luis, F. H., Vazquez, G. N., Tapia, A., Cortes, R., Hernandez, M. & Castillo, R. (2002). Bioorg. Med. Chem. Lett. 12, 2221-2224.
-
(2002)
Bioorg. Med. Chem. Lett
, vol.12
, pp. 2221-2224
-
-
Valdez, J.1
Cedillo, R.2
Campos, A.H.3
Yepez, L.4
Luis, F.H.5
Vazquez, G.N.6
Tapia, A.7
Cortes, R.8
Hernandez, M.9
Castillo, R.10
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