X-ray diffraction and continuum measurements in silicon crystals shocked below the elastic limit

Applied Physics Letters

Volumn 90, Issue 5, 2007, Pages

  Turneaure, Stefan J ^a   Gupta, Y M ^b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUUM RESPONSE; ELASTIC CONSTANTS; LASER INTERFEROMETRY; PEAK STRESSES;

CONTINUUM MECHANICS; INTERFEROMETRY; SILICON; SINGLE CRYSTALS; X RAY DIFFRACTION;

SHOCK WAVES;

EID: 33846972271     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2436638     Document Type: Article

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