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Volumn 24, Issue 1, 2007, Pages 46-48
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Study of the effect of substrate bias on the electrical properties of sputtered HfO2 thin film deposited on silicon substrate
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Author keywords
Electrical conductivity; Substrates; Thin films
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Indexed keywords
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EID: 33846949435
PISSN: 13565362
EISSN: None
Source Type: Journal
DOI: 10.1108/13565360710725946 Document Type: Article |
Times cited : (5)
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References (12)
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