Electrical impedance tomography based on sensitivity theorem with singular value decomposition

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings

Volumn 7 VOLS, Issue , 2005, Pages 1488-1491

  Yan, Peimin ^a   Wang, Shuozhong ^a   Shi, Luming ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC IMPEDANCE; IMAGE ANALYSIS; PARAMETER ESTIMATION; THEOREM PROVING;

ELECTRICAL IMPEDANCE TOMOGRAPHY (EIT); SENSITIVITY THEOREM; SINGULAR VALUE DECOMPOSITION;

COMPUTERIZED TOMOGRAPHY;

EID: 33846902082     PISSN: 05891019     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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7. Andrea Borsic, BSc "Regularisation Methods for Imaging from Electrical Measurements," Ph.D. School of Engineering Oxford Brookes University, July 2002.