Effect of the resolution on the uncertainty evaluation

Metrologia

Volumn 43, Issue 6, 2006, Pages

  Cordero, Raul R ^a   Seckmeyer, Gunther ^a   Labbe, Fernando ^b  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b DEPARTAMENTO DE FÍSICA   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT THEORY; MEASUREMENTS; SENSITIVITY ANALYSIS; STATISTICAL METHODS;

MEAN; STANDARD DEVIATION;

DIGITAL INSTRUMENTS;

EID: 33846893001     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/43/6/N01     Document Type: Article

References (8)

1. 1993 ISO Guide to the Expression of Uncertainty in Measurement (Geneva: ISO) p 101
2. Weise K and Wöger W 1993 A Bayesian theory of measurement uncertainty Meas. Sci. Technol. 4 1-11
3. Lira I and Kyriazis G 1999 Bayesian inference from measurement information Metrologia 36 163-9
4. Elster C 2000 Evaluation of measurement uncertainty in the presence of combined random and analogue- to-digital conversion errors Meas. Sci. Technol. 11 1359-63
5. Lira I G 2006 Resolution revisited Metrologia 43 L14-7
6. Lira I and Wöger W 1997 The evaluation of standard uncertainty in the presence of limited resolution of indicating devices Meas. Sci. Technol. 8 441-3
7. Frenkel R B and Kirkup L 2005 Monte Carlo-based estimation of uncertainty owing to limited resolution of digital instruments Metrologia 42 L27-30
8. Kacker R and Jones A 2003 On use of Bayesian statistics to make the Guide to the Expression of Uncertainty in Measurement consistent Metrologia 40 235-48