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Volumn 51, Issue 24, 2006, Pages 6419-6436

Charge collection efficiency in ionization chambers exposed to electron beams with high dose per pulse

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ENERGY ABSORPTION; IONIZATION CHAMBERS; IONS; LASER PULSES; VOLTAGE MEASUREMENT;

EID: 33846866290     PISSN: 00319155     EISSN: 13616560     Source Type: Journal    
DOI: 10.1088/0031-9155/51/24/009     Document Type: Article
Times cited : (84)

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    • Boag, J.W.1
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  • 8
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    • Conere, T.J.1    Boag, J.W.2
  • 9
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