A collaborative study into the determination of boron in glass using x-ray fluorescence (XRF) spectroscopy

Glass Technology: European Journal of Glass Science and Technology Part A

Volumn 47, Issue 4, 2006, Pages 103-111

  Guadagnino, Emanuel ^a   Sundberg, Peter ^b   Brochot, Dominique ^c  

^a STAZIONE SPERIMENTALE DEL VETRO   (Italy)

^b Glafo the Glass Research Institute   (Sweden)

^c CETC ^*  (France)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ELEMENTS; MATRIX CORRECTION MODELS; WET CHEMICAL METHODS; X-RAY FLUORESCENCE (XRF) SPECTROSCOPY;

BORON; ERROR CORRECTION; FLUORESCENCE; IRRADIATION; MATRIX ALGEBRA; X RAY SPECTROSCOPY;

GLASS;

EID: 33846859091     PISSN: 00171050     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. 3 in glass by in-house methods, Glass Technol., 2002, 43 (4), 82-6.
2. Reed, R. A. Spectrophotometric method for the determination of boron in glasses, glazes and ceramic colours, Analyst, 1977, 102, 831-6.
3. Schucker, G. D., Magliocca T. S. & Su Yao Sin, Spectrophotometric determination of boron in siliceous materials with Azometine H, Analyt. Chim. Acta, 1975, 75, 95-100.
4. Brouwer, P. Theory of XRF, 2003, Ed. PANalytical B.V., Almelo, The Netherlands.
5. Falcone, R., Hreglich, S., Vallotto, M. & Verità, M. X-ray fluorescence analysis of raw materials for the glass and ceramic industry, Glass Technol., 2002, 43 (1), 39-48.
6. Bruker User's Manual Introduction to x-ray fluorescence analysis (XRF), DOC-M84-E06001, July 2004.
7. Jenkins, R., Gould, R. W., Gedke, D. Quantitative X-ray Spectrometry, Second edition, 1995, Marcel Decker Inc., New York, USA.
8. Medicus, G. & Ackermann, G. Beitrag zur physikalischen Matrixkorrektur bei der RFA (Physical matrix correction for XRF measurements). Fresenius Z. Anal. Chem., 1986, 667-675.