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Volumn 98, Issue 5, 2007, Pages

Structure of liquid SiO2: A measurement by high-energy X-ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords

HEATING; HIGH TEMPERATURE APPLICATIONS; LASER BEAM EFFECTS; LIQUIDS; TEMPERATURE DISTRIBUTION; X RAY DIFFRACTION;

EID: 33846837607     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.98.057802     Document Type: Article
Times cited : (102)

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