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Volumn 75, Issue 7, 2007, Pages

Damage evolution in low-energy ion implanted silicon

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EID: 33846821501     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.075304     Document Type: Article
Times cited : (18)

References (43)
  • 2
    • 0026138906 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2085734
    • M. D. Giles, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2085734 138, 1160 (1991).
    • (1991) J. Electrochem. Soc. , vol.138 , pp. 1160
    • Giles, M.D.1
  • 6
    • 0034899614 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.63.195206
    • S. Libertino, S. Coffa, and J. L. Benton, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.63.195206 63, 195206 (2001).
    • (2001) Phys. Rev. B , vol.63 , pp. 195206
    • Libertino, S.1    Coffa, S.2    Benton, J.L.3
  • 7
    • 0001070471 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.122116
    • Young Hoon Lee, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.122116 73, 1119 (1998).
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 1119
    • Hoon Lee, Y.1
  • 8
    • 36149019492 scopus 로고
    • PRVAAH 0096-8250 10.1103/PhysRev.138.A543
    • G. D. Watkins and J. W. Corbett, Phys. Rev. PRVAAH 0096-8250 10.1103/PhysRev.138.A543 138, A543 (1965).
    • (1965) Phys. Rev. , vol.138 , pp. 543
    • Watkins, G.D.1    Corbett, J.W.2
  • 11
    • 0026138906 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2085734
    • M. D. Giles, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2085734 138, 1160 (1991).
    • (1991) J. Electrochem. Soc. , vol.138 , pp. 1160
    • Giles, M.D.1
  • 29
    • 33846830488 scopus 로고    scopus 로고
    • Masters Thesis, Université de Montréal, Montreal, Quebec, Canada
    • J.-F. Mercure, Masters Thesis, Université de Montréal, Montreal, Quebec, Canada (2003).
    • (2003)
    • Mercure, J.-F.1
  • 30
    • 0242692574 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.68.125209
    • F. Valiquette and N. Mousseau, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.125209 68, 125209 (2003).
    • (2003) Phys. Rev. B , vol.68 , pp. 125209
    • Valiquette, F.1    Mousseau, N.2
  • 35
    • 0021424733 scopus 로고
    • APPLAB 0003-6951 10.1063/1.94925
    • H. Aharoni and P. L. Swart, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.94925 44, 892 (1984).
    • (1984) Appl. Phys. Lett. , vol.44 , pp. 892
    • Aharoni, H.1    Swart, P.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.