Ionization-induced proton transfer in thymine-ammonia van der Waals clusters

International Journal of Mass Spectrometry

Volumn 261, Issue 1, 2007, Pages 32-37

  Kim, Nam Joon ^a   Kim, Hyung Min ^b   Kim, Seong Keun ^b  

^a Chungbuk National University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

Proton transfer; Reflectron time of flight mass spectrometry; Resonant 2 photon ionization; Thymine; van der Waals cluster

Indexed keywords

EID: 33846816900     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2006.07.017     Document Type: Article

References (41)

1. von Sonntag C. The Chemical Basis of Radiation Biology (1987), Taylor and Francis, London
2. Yan M., Becker D., Summerfield S., Renke P., and Sevilla M.D. J. Phys. Chem. 96 (1992) 1983
3. Little J.B. Carcinogenesis 21 (2000) 397
4. Urbach F. The Biological Effects of Ultraviolet Radiation (1969), Pergamon, New York
5. Kantor G.J. Photochem. Photobiol. 41 (1985) 741
6. Hwang C.T., Stumpf C.L., Yu Y.-Q., and Kenttämaa H.I. Int. J. Mass Spectrom. 182/183 (1999) 253
7. Steenken S. Free Radic. Res. Commun. 16 (1992) 349
8. Steenken S. Chem. Rev. 89 (1989) 503
9. Close D.M. J. Phys. Chem. B 107 (2003) 864
10. Kobayashi K., and Tagawa S. J. Am. Chem. Soc. 125 (2003) 10213
11. Price J.M., Petzold C.J., Byrd H.C.M., and Kenttämaa H.I. Int. J. Mass Spectrom. 212 (2001) 455
12. Takada T., Kawai K., Fujitsuka M., and Majima T. Proc. Natl. Acad. Sci. U.S.A. 101 (2004) 14002
13. Choi K.-W., Lee J.-H., and Kim S.K. J. Am. Chem. Soc. 127 (2005) 15674
14. Crespo-Hernández C.E., Arce R., Ishikawa Y., Gorb L., Leszczynski J., and Close D.M. J. Phys. Chem. A 108 (2004) 6373
15. Wagner J.R., van Lier J.E., and Johnston L.J. Photochem. Photobiol. 52 (1990) 333
16. Sevilla M.D. J. Phys. Chem. 75 (1971) 626
17. Sevilla M.D., Paemel C.V., and Zorman G. J. Phys. Chem. 76 (1972) 3577
18. Deeble D.J., Schuchmann M.N., Steenken S., and von Sonntag C. J. Phys. Chem. 94 (1990) 8186
19. Close D.M. Radiat. Res. 135 (1993) 1
20. Lomoth R., and Brede O. Chem. Phys. Lett. 288 (1998) 47
21. Geimer J., Brede O., and Beckert D. Chem. Phys. Lett. 276 (1997) 411
22. Close D., Forde G., Gorb L., and Leszczynski J. Struct. Chem. 14 (2003) 451
23. Wetmore S.D., Himo F., Boyd R.J., and Eriksson L.A. J. Phys. Chem. B 102 (1998) 7484
24. Naumov S., Barthel A., Reinhold J., Dietz F., Geimer J., and Beckert D. Phys. Chem. Chem. Phys. 2 (2000) 4207
25. Brutschy B. Chem. Rev. 92 (1992) 1567
26. Castleman Jr. A.W., and Wei S. Annu. Rev. Phys. Chem. 45 (1994) 685
27. Coolbaugh M.T., Vaidyanathan G., Peifer W.R., and Garvey J.F. J. Phys. Chem. 95 (1991) 8337
28. Daly G.M., and El-Shall M.S. J. Phys. Chem. 99 (1995) 5283
29. Kang H., Lee K.T., and Kim S.K. Chem. Phys. Lett. 359 (2002) 213
30. Kim N.J., Kang H., Jeong G., Kim Y.S., Lee K.T., and Kim S.K. Proc. Natl. Acad. Sci. U.S.A. 98 (2001) 4841
31. Kim N.J., Kang H., Jeong G., Kim Y.S., Lee K.T., and Kim S.K. J. Chem. Phys. 115 (2001) 7002
32. Kim N.J., Kang H., Jeong G., Kim Y.S., Lee K.T., and Kim S.K. J. Phys. Chem. A 104 (2000) 6552
33. Kim N.J., Kim Y.S., Jeong G., Ahn T.K., and Kim S.K. Int. J. Mass Spectrom. 219 (2002) 11
34. Brady B.B., Peteanu L.A., and Levy D.H. Chem. Phys. Lett. 147 (1988) 538
35. Kim S.K., Lee W., and Herschbach D.R. J. Phys. Chem. 100 (1996) 7933
36. Grégoire G., Dedonder-Lardeux C., Jouvet C., Martrenchard S., Peremans A., and Solgadi D. J. Phys. Chem. A 104 (2000) 9087
37. Knochenmuss R., and Fischer I. Int. J. Mass Spectrom. 220 (2002) 343
38. Bernhard W.A., Barnes J., Mercer K.R., and Mroczka N. Radiat. Res. 140 (1994) 199
39. Frisch M.J., Trucks G.W., Schlegel H.B., Scuseria G.E., Robb M.A., Cheeseman J.R., Montgomery Jr. J.A., Vreven T., Kudin K.N., Burant J.C., Millam J.M., Iyengar S.S., Tomasi J., Barone V., Mennucci B., Cossi M., Scalmani G., Rega N., Petersson G.A., Nakatsuji H., Hada M., Ehara M., Toyota K., Fukuda R., Hasegawa J., Ishida M., Nakajima T., Honda Y., Kitao O., Nakai H., Klene M., Li X., Knox J.E., Hratchian H.P., Cross J.B., Adamo C., Jaramillo J., Gomperts R., Stratmann R.E., Yazyev O., Austin A.J., Cammi R., Pomelli C., Ochterski J.W., Ayala P.Y., Morokuma K., Voth G.A., Salvador P., Dannenberg J.J., Zakrzewski V.G., Dapprich S., Daniels A.D., Strain M.C., Farkas O., Malick D.K., Rabuck A.D., Raghavachari K., Foresman J.B., Ortiz J.V., Cui Q., Baboul A.G., Clifford S., Cioslowski J., Stefanov B.B., Liu G., Liashenko A., Piskorz P., Komaromi I., Martin R.L., Fox D.J., Keith T., Al-Laham M.A., Peng C.Y., Nanayakkara A., Challacombe M., Gill P.M.W., Johnson B., Chen W., Wong M.W., Gonzalez C., and Pople J.A. Gaussian 03, Revision C.02 (2004), Gaussian Inc., Wallingford, CT
40. Wei S., Tzeng W.B., and Castleman Jr. A.W. J. Chem. Phys. 92 (1990) 332
41. Lias S.G., Liebman J.F., and Levin R.D. J. Phys. Chem. Ref. Data 13 (1984) 695