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Materials Science and Engineering: B

Volumn 137, Issue 1-3, 2007, Pages 310-314

Effects of film thickness on microstructure and electrical properties of the pyrite films

(2) Huang, L Y a Meng, L a

a ZHEJIANG UNIVERSITY (China)

Author keywords

Crystallization; Electrical properties; FeS2; Microstructure; Surface defects; Thin films

Indexed keywords

CARRIER MOBILITY; CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MICROSTRUCTURE; PYRITES; THICKNESS MEASUREMENT;

CARRIER BEHAVIORS; SURFACE DEFECTS;

THIN FILMS;

EID: 33846795917 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/j.mseb.2006.11.029 Document Type: Article

Times cited : (36)

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