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Volumn 100, Issue 1-3, 2007, Pages 167-172

Microporous high-surface area layered CeO2

Author keywords

High surface area layered cerium dioxide; Microporous

Indexed keywords

CALCINATION; CERIUM COMPOUNDS; MORPHOLOGY; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 33846783048     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micromeso.2006.10.034     Document Type: Article
Times cited : (26)

References (27)
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    • R.X. Valenzuela, G. Bueno, V. Cortés Corberán, Y. Xu, C. Chen. Abstracts 215th ACS Nat. Meeting Dallas, 1998, COLL-085.
  • 20
    • 33846829733 scopus 로고    scopus 로고
    • T. Kirk, J. Winnick, in: Proceedings of the 27th Inter-society Energy Conversion Engineering Conference, August 1992.
  • 21
    • 0001856349 scopus 로고    scopus 로고
    • Defect and microstructure analysis by diffraction
    • International Union of Crystallography, Oxford Science Publications
    • Snyder R.L., Fiala J., and Bunge H.J. Defect and microstructure analysis by diffraction. International Union of Crystallography. Monographs on Crystallography vol. 10 (1999), Oxford Science Publications
    • (1999) Monographs on Crystallography , vol.10
    • Snyder, R.L.1    Fiala, J.2    Bunge, H.J.3
  • 22
    • 33846786843 scopus 로고    scopus 로고
    • TOPAS 3.1, General profile and structure analysis software for powder diffraction data, User's manual, Bruker AXS GmbH, Karlsruhe, Germany.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.