Stress testing a supply chain using simulation

Proceedings - Winter Simulation Conference

Volumn 2005, Issue , 2005, Pages 1650-1657

  Jain, Sanjay ^a   Swee, Leong ^b  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; PRODUCTION CONTROL; RISK ASSESSMENT; STRATEGIC PLANNING; STRESS ANALYSIS;

DEFENSE CONTRACTOR; MOBILIZATION VOLUME; STRESS TESTING; SUPPLY CHAIN;

RETAIL STORES;

EID: 33846693499     PISSN: 08917736     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WSC.2005.1574435     Document Type: Conference Paper

References (8)

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2. Helo, P.T. 2000. Dynamic Modelling of Surge Effect and Capacity Limitation in Supply Chains. International Journal of Production Research, Vol. 38, No. 17, pp 4521-4533.
3. Jain, S. 2006 (forthcoming). A Comprehensive Framework for Supply Chain Modeling & Simulation, International Journal of Simulation and Process Modeling, Special issue on Supply Chain Modeling, expected publication Fall 2006.
4. Klapper, L.S., N. Hamblin, L. Hutchison, L. Novak, and J. Vivar. 1999. Supply Chain Management: A Recommended Performance Measurement Scorecard, Logistics Management Institute, Report No. LG803R1, Available via http://www.eitoolkit.com/tools//initiation/sc_mgmt_scorecard.pdf [Accessed July 25, 2005].
5. Supply Chain Council. 2003. Supply-Chain Operations Reference-Model Version 6.0. Supply Chain Council, Inc., Pittsburgh, PA.
6. Terzi, S., and S. Cavalieri. 2004. Simulation in the supply chain context: a survey. Computers in Industry, Vol. 53, pp. 3-16.
7. Thompson, D. 2005. Using Virtual Manufacturing to Improve Supply Chain Effectiveness. Proceedings of the Diminishing Manufacturing Sources and Material Shortages conference, Available via http://www.dmsms2005.utcdayton. com [Accessed on July 21, 2005].
8. Tsai, T.P. and Faa-Ching Wang. 2004. Improving Supply Chain Management: a model for Collaborative Quality Control. IEEE Conference and Workshop on Advanced Semiconductor Manufacturing (ASMC '04), May 4-6, pp. 36-42.