A first step for an INL spectral-based BIST: The memory optimization

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 22, Issue 4-6, 2006, Pages 351-357

  Kerzerho V ^a,b   Bernard, S ^a   Cauvet, P ^b   Janik, J M ^c  

^a LIRMM   (France)

^b NXP SEMICONDUCTORS   (France)

^c UNIVERSITÉ DE CAEN   (France)

Author keywords

Analog to digital converter testing; Fast Fourier transform; Fourier series expansion; Integral non linearity; Polynomial fitting

Indexed keywords

ANALOG TO DIGITAL CONVERSION; FAST FOURIER TRANSFORMS; INTEGRAL EQUATIONS; NONLINEAR SYSTEMS; OPTIMIZATION; PARAMETER ESTIMATION;

ANALOG TO DIGITAL CONVERTER TESTING; FOURIER SERIES EXPANSION; INTEGRAL NONLINEARITY; POLYNOMIAL FITTING;

BUILT-IN SELF TEST;

EID: 33846691924     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-006-0186-z     Document Type: Article

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