Chapter 8 Heat and electricity transport through interfaces

Semiconductors and Semimetals

Volumn 70, Issue C, 2001, Pages 245-271

  Bartkowiak, M ^a,b   Mahan, G D ^a,b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT TRANSFER; SEEBECK COEFFICIENT; THERMIONIC EMISSION; THERMODYNAMIC STABILITY; THERMOELECTRICITY;

EFFECTIVE THERMAL CONDUCTIVITY; ELECTRICAL COMPONENTS; HEAT AND ELECTRICITY; SEMICONDUCTING LAYER; THERMAL BOUNDARY RESISTANCE; THERMAL INSTABILITIES; THERMO-ELECTRIC MATERIALS; THERMOELECTRIC DEVICES;

THERMAL CONDUCTIVITY;

EID: 33846672512     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(01)80142-3     Document Type: Article

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