Multi-pinhole SPECT imaging with silicon strip detectors

IEEE Nuclear Science Symposium Conference Record

Volumn 5, Issue , 2005, Pages 2752-2756

  Peterson, Todd E ^a,b   Shokouhi, Sepideh ^a,b   Furenlid, Lars R ^a,c   Wilson, Donald W ^c  

^a IEEE   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTI PINHOLE SPECT IMAGING; SILICON STRIP DETECTORS; SMALL ANIMAL SPECT SYSTEMS; SPATIAL RESOLUTION;

COMPUTERIZED TOMOGRAPHY; DETECTORS; SENSITIVITY ANALYSIS; SILICON;

IMAGING SYSTEMS;

EID: 33846648828     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2005.1596906     Document Type: Conference Paper

References (8)

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