Resonance frequency shift in a cavity with a thin conducting film near a conducting wall

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 363, Issue 1-2, 2007, Pages 33-37

  Braggio, C ^a   Bressi, G ^b   Carugno, G ^c   Dodonov, A V ^d   Dodonov, V V ^e   Galeazzi, G ^f   Ruoso, G ^f   Zanello, D ^g  

^a UNIVERSITY OF FERRARA   (Italy)

^b INFN SEZIONE DI PAVIA   (Italy)

^c SEZIONE DI PADOVA   (Italy)

^d FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^e UNIVERSITY OF BRASILIA   (Brazil)

^f LABORATORI NAZIONALI DI LEGNARO   (Italy)

^g INFN SEZIONE DI ROMA   (Italy)

Author keywords

Damping; Frequency shift; Quality factor; Resonance cavities; Skin depth; Thin films

Indexed keywords

DAMPING; NATURAL FREQUENCIES;

ELECTROMAGNETIC CAVITY; FREQUENCY SHIFT; QUALITY FACTORS; RESONANCE CAVITIES; RESONANCE FREQUENCIES; RESONANCE FREQUENCY SHIFT; SKIN DEPTH; THIN CONDUCTING FILMS;

THIN FILMS;

EID: 33846627791     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2006.11.071     Document Type: Article

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