Effect of randoms on signal-to-noise-ratio in TOF PET

IEEE Nuclear Science Symposium Conference Record

Volumn 3, Issue , 2005, Pages 1590-1595

  Conti, Maurizio ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RANDOM COINCIDENCE; RANDOM REDUCTION; TIME RESOLUTION; TIME-OF-FLIGHT (TOF);

MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; RANDOM PROCESSES; SCANNING; SIGNAL TO NOISE RATIO;

POSITRON EMISSION TOMOGRAPHY;

EID: 33846600769     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2005.1596623     Document Type: Conference Paper

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