Identifying semiconductors by D.C. ionization conductivity

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2005, Pages 1132-1134

  Derenzo, Stephen E ^a,b   Bourret Courchesne, Edith ^b   James, Floyd J ^b,c   Klintenberg, Mattias K ^b   Porter Chapman, Yetta ^b   Wang, Jie ^b   Weber, Marvin J ^b  

^a IEEE   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c NORTH CAROLINA A AND T STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE POWDERS; DETECTOR MATERIALS; HIGH-INTENSITY SOURCES;

ELECTRIC FIELD EFFECTS; ELECTRONS; GAMMA RAYS; IONIC CONDUCTION; IONIZATION; RADIATION DETECTORS; SINGLE CRYSTALS;

SEMICONDUCTOR MATERIALS;

EID: 33846600320     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2005.1596450     Document Type: Conference Paper

References (10)

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