Temperature dependences of the resistivity and the ferromagnetic resonance linewidth in permalloy thin films

IEEE Transactions on Magnetics

Volumn 42, Issue 10, 2006, Pages 3323-3325

  Counil, G ^a   Devolder, T ^a   Kim, J V ^a   Crozat, P ^a   Chappert, C ^a   Zoll, S ^b   Fournel, R ^b  

^a UNIV PARIS SUD   (France)

^b STMICROELECTRONICS   (France)

Author keywords

Damping; Magnetization; Thin films

Indexed keywords

DAMPING; ELECTRON SCATTERING; FERROMAGNETIC RESONANCE; MAGNETIC RELAXATION; MAGNETIZATION; MAGNETORESISTANCE;

ELECTRON SCATTERING CHANNELS; FERROMAGNETIC RESONANCE LINEWIDTH; MAGNON RELAXATION; PERMALLOY THIN FILMS;

MAGNETIC THIN FILMS;

EID: 33846592204     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2006.879718     Document Type: Article

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