CZT detectors read out with the RENA-2 ASIC

IEEE Nuclear Science Symposium Conference Record

Volumn 1, Issue , 2005, Pages 211-215

  Matteson, James L ^a,b   Skelton, R Thomas ^b   Pelling, Michael R ^b   Suchy, Slawomir ^b   Cajipe, Victoria B ^c   Clajus, Martin ^c   Hayakawa, Satoshi ^c   Tümer, Tümay O ^a,c  

^a IEEE   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Durham Scientific Crystals Ltd   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPTON TELESCOPES; CZT DETECTORS; MULTIPLE SITE INTERACTIONS; SPECTRAL DIAGNOSTIC PROBES;

AMPLIFIERS (ELECTRONIC); IMAGING SYSTEMS; OPTIMIZATION; PARAMETER ESTIMATION; READOUT SYSTEMS; TELESCOPES;

GAMMA RAYS;

EID: 33846565310     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2005.1596238     Document Type: Conference Paper

References (7)

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2. A. E. Bolotnikov, S. E. Boggs, C. M. Hubert Chen, W. R. Cook III, H. Chen, F. A. Harrison, S. M. Schindler, "Investigation of optimal contact geometries for CdZnTe pixel detectors", Proc. SPIE, 4141, 243, 2000.
3. J. L. Matteson*, M. R. Pelling, R. T. Skelton, "CZT detectors with 3-D readout for gamma-ray spectroscopy and imaging", Proc. SPIE, 4784, 1, 2002.
4. H.H. Barrett, J.D. Eskin and H.B. Barber, "Charge Transport in Arrays of Semiconductor Gamma-Ray Detectors", Phys. Rev. Lett., 75, no.1, 156, 1995.
5. P.N. Luke, "Electrode Configuration and Energy Resolution in Gamma-Ray Detectors", in Proceedings of the 9th International Workshop on Room Temperature Semiconductor X- and Gamma-Ray Detectors, Associated Electronics and Applications, Grenoble, France Sept. 18-22, 1995.
6. E. Kalemci, E., and J. L. Matteson, "Investigation of Charge Sharing Among Electrode Strips for a CdZnTe Detector", NIMA, 478, 529, 2002.
7. T. O. Tümer, V. B. Cajipe, M. Clajus, F. Duttweiler, S. Hayakawa, J. L. Matteson, A. Shirley, O. Yossifor, "Test results of a CdZnTe pixel detector read out by RENA-2 IC", Nuclear Science Symposium Conference Record, 2004 IEEE, Volume 7, 16-22 Oct. 2004 pp. 4369-4372.