A general quantitative identification algorithm of subsurface defect for infrared thermography

The Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005

Volumn 2, Issue , 2005, Pages 341-342

  Fan, Chunli ^a   Sun, Fengrui ^a   Yang, Li ^a  

^a NAVAL UNIVERSITY OF ENGINEERING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; INFRARED DEVICES; SENSORS; SURFACE PROPERTIES; TEMPERATURE MEASUREMENT; THERMAL CONDUCTIVITY;

INFRARED SENSORS; STEADY-STATE THERMOGRAPHY; SUBSURFACE DEFECTS;

THERMOGRAPHY (IMAGING);

EID: 33846537947     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. M. Zong, et al., "Quantitative detection of subsurface defects by pulse-heating infrared thermography", SPIE, vol. 3558, 1998, 402-406.
2. D. Turler, "Predicting the geometry and location of defects in adhesive and spot-welded lap joints using steady-state thermographic techniques", SPIE, vol. 3700, 1999, 54-62.
3. C. Fan, et al. "Study on method of inspection and quantitative breakage diagnoses of high voltage line and cable by infrared thermography", Proceedings of Chinese Society for Electrical Engineering, 2005. in press.