Characterization of the barrier layer of nanoporous alumina films prepared using two different contact configurations

Electrochimica Acta

Volumn 52, Issue 8 SPEC. ISS., 2007, Pages 2815-2821

  Koh, Guiwan ^a   Agarwal, Shuchi ^a   Cheow, Pui Sze ^a   Toh, Chee Seng ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Alumina; Anodization; Barrier layer; Nanostructure; Sensor

Indexed keywords

ALUMINA; ANODIC OXIDATION; CHARACTERIZATION; CHARGE TRANSFER; CYCLIC VOLTAMMETRY; ELECTROCHEMISTRY; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PLATINUM; RATE CONSTANTS; SCANNING ELECTRON MICROSCOPY;

ANODIZATION; BARRIER LAYERS; NANOPOROUS ALUMINA FILMS; PIPETTE ANODIZATION METHOD;

THIN FILMS;

EID: 33846520489     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2006.08.065     Document Type: Article

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