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Volumn 63, Issue 1, 2007, Pages 111-117

In-situ high-pressure study of the ordered phase of ethyl propionate

Author keywords

Disorder; High pressure; In situ crystallization; Polymorphism; Pressure freezing

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; HIGH PRESSURE EFFECTS; IN SITU PROCESSING; MOLECULAR DYNAMICS;

EID: 33846499082     PISSN: 01087681     EISSN: 01087681     Source Type: Journal    
DOI: 10.1107/S010876810603477X     Document Type: Article
Times cited : (7)

References (24)
  • 5
    • 8644241054 scopus 로고    scopus 로고
    • edited by A. Katrusiak & P. F. McMillan, pp, Dordrecht: Kluwer Academic Publishers
    • Budzianowski, A. & Katrusiak, A. (2004). High-Pressure Crystallography, edited by A. Katrusiak & P. F. McMillan, pp. 101-111. Dordrecht: Kluwer Academic Publishers.
    • (2004) High-Pressure Crystallography , pp. 101-111
    • Budzianowski, A.1    Katrusiak, A.2
  • 11
    • 33846482495 scopus 로고    scopus 로고
    • Grimwood, D, Wolff, S. K, McKinnon, J, Spackman, M. & Jayatilaka, D, 2005, Crystal Explorer, Version 1.5.0. University of Western Australia
    • Grimwood, D., Wolff, S. K., McKinnon, J., Spackman, M. & Jayatilaka, D. (2005). Crystal Explorer, Version 1.5.0. University of Western Australia.
  • 14
    • 33645077454 scopus 로고    scopus 로고
    • Adam Mickiewicz University, Poznań, Poland
    • Katrusiak, A. (2003). REDSHAD. Adam Mickiewicz University, Poznań, Poland.
    • (2003) REDSHAD
    • Katrusiak, A.1
  • 15
    • 33645064389 scopus 로고    scopus 로고
    • Adam Mickiewicz University, Poznań, Poland
    • Katrusiak, A. (2004a). REDSHUB. Adam Mickiewicz University, Poznań, Poland.
    • (2004) REDSHUB
    • Katrusiak, A.1
  • 20
    • 33846510388 scopus 로고    scopus 로고
    • Oxford Diffraction (2003). CrysAlis CCD and CrysAlis RED, GUI versions. Oxford Diffraction, Wroclaw, Poland.
    • Oxford Diffraction (2003). CrysAlis CCD and CrysAlis RED, GUI versions. Oxford Diffraction, Wroclaw, Poland.
  • 24
    • 33846474815 scopus 로고
    • Siemens Analytical X-ray Instruments Inc, Madison, Wisconsin, USA
    • Siemens (1990). XP. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1990) XP
    • Siemens1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.