Subpixel localization in vision measurement for the size of precision part

Nami Jishu yu Jingmi Gongcheng/Nanotechnology and Precision Engineering

Volumn 4, Issue 4, 2006, Pages 311-313

  Wang, Yu Hua ^a   Peng, Ming Zai ^a   Cheng, Xiang ^a  

^a FOSHAN UNIVERSITY   (China)

Author keywords

Fresnel diffraction; Size measurement; Subpixel; Vision measurement

Indexed keywords

FRESNEL DIFFRACTION; SIZE MEASUREMENT; SUBPIXEL; VISION MEASUREMENT;

DIFFRACTIVE OPTICS; EDGE DETECTION; IMAGING TECHNIQUES; PRECISION ENGINEERING; VISION;

CHARGE COUPLED DEVICES;

EID: 33846481210     PISSN: 16726030     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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4. Gorman L O'. Subpixel precision of straight edged shapes for registration and measurement [J]. IEEE Trans on PAMI, 1996, 18(7): 746-751.
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