An ellipsometric study of polymer film curing: 2,6-Bis(3-aminophenoxy) benzonitrile/4,4′oxidiphthalic anhydride poly(amic acid)

Polymer

Volumn 47, Issue 8, 2006, Pages 2822-2829

  Yan, Li ^a   Park, Cheol ^b   Ounaies, Zoubeida ^c   Irene, Eugene A ^a  

^a The University of North Carolina at Chapel Hill   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

^c TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Polymer curing; Real time monitoring; Spectroscopic ellipsometry

Indexed keywords

CURING; DENSIFICATION; ELLIPSOMETRY; ORGANIC POLYMERS; SPECTROSCOPIC ANALYSIS; THIN FILMS;

POLYMER CURING; REAL TIME MONITORING; SPECTROSCOPIC ELLIPSOMETRY;

PLASTIC FILMS;

ABSORPTION; FILM; OPTICAL PROPERTY; POLYMER;

EID: 33846461325     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2006.02.056     Document Type: Article

References (29)

1. In: Wilson D., Stenzenberger H.D., and Hergenrother P.M. (Eds). Polyimides (1990), Chapman and Hall, New York
2. In: Feger C., Khojasteh M.M., and Htoo M.S. (Eds). Advances in polyimide: science and technology (1993), CRC Press, Boca Raton, FL
3. Simpson J.O., Welch S.S., and Clair T.L. Proc Mater Res Soc Symp: Mater Smart Syst II 413 (1995) 351-356
4. Simpson J.O., Ounaies Z., and Fay C. Proc Mater Res Soc Symp: Mater Smart Syst II 459 (1997) 59-64
5. Ounaies Z., Park C., Harrison J.S., Smith Jr. J.G., and Hinkley J. SPIE Proc Smart Struct Mater 3669 (1999) 171-178
6. Park C., Ounaies Z., Su J., Smith Jr. J.G., and Harrison J.S. Proc Mater Res Soc Symp: Mater Smart Syst II 600 (1999) 153-158
7. Park C., Ounaies Z., Wise K.E., and Harrison J.S. Polymer 45 (2004) 5417-5425
8. Kern W., and Puotinen D. RCA Rev 31 (1970) 187-206
9. Azzam R.M.A., and Bashara N.M. Ellipsometry and polarized light (1977), North-Holland, New York
10. Humlíček J. Polarized light and ellipsometry. In: Tompkins H.G., and Irene E.A. (Eds). Handbook of ellipsometry (2005), William Andrew Publishing, New York 77
11. Dezern J.F., and Croall C.I. NASA technical memorandum (1991) p. 104178
12. Dine-Hart R.A., and Wright W.W. J Appl Polym Sci 11 (1967) 609-627
13. Dine-Hart R.A., and Wright W.W. Makromol Chem 143 (1971) 189-206
14. Pramoda K.P., Liu S., and Chung T.S. Macromol Mater Eng 287 (2002) 931-937
15. Kan L., and Kao K.C. J Chem Phys 98 (1993) 3445-3451
16. LaFemina J.P., Arjavalingam G., and Hougham G. J Chem Phys 90 (1989) 5154-5160
17. LaFemina J.P., and Kafafi S.A. J Phys Chem 97 (1993) 1455-1458
18. Kowalczyk S.P., Stafström S., Brédas J.L., Salaneck W.R., and Jordan-Sweet J.L. Phys Rev B 41 (1990) 1645-1656
19. Gordina T.A., Kotov B.V., Kolninov O.V., and Pravednikov A.N. Vysokomol Soyed B 15 (1973) 378-383
20. Kotov B.V. Zh Fiz Khim 62 (1988) 2709-2727
21. Endo A., and Yada T.J. Electrochem Soc 132 (1985) 155-158
22. Takahashi N., Yoon D.Y., and Parrish W. Macromolecules 17 (1984) 2583-2588
23. Feger C. Society of Plastic Engineers ANTEC Technical Papers (1987) p. 967-87
24. Jou J.H., and Huang P.T. Macromolecules 24 (1991) 3796-3803
25. ® Software manual, J.A. Woollam Co., Inc. (unpublished).
26. Ku C.C., and Liepins R. Electrical properties of polymers (1987), Hanser Publishers, Munich
27. Hougham G., Tesoro G., and Viehbeck A. Macromolecules 29 (1996) 3453-3456
28. Pliskin W.A. J Vac Sci Technol 14 (1977) 1064-1081
29. Irene E.A. In situ real-time characterization of surface and film growth processes via ellipsometry. In: Auciello O., and Krauss A.R. (Eds). In situ real-time characterization of thin films (2001), Wiley-Interscience, New York 77