Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique

Journal of Applied Physics

Volumn 63, Issue 7, 1988, Pages 2466-2468

  Dube, D C ^a   Lanagan, M T ^a   Kim, J H ^a   Jang, S J ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846459231     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.341024     Document Type: Article

References (23)