Compressibility and pressure-induced amorphization of guest-free melanophlogite: An in-situ synchrotron X-ray diffraction study

American Mineralogist

Volumn 92, Issue 1, 2007, Pages 166-173

  Xu, Hongwu ^a,b   Zhang, Jianzhong ^b   Zhao, Yusheng ^b   Guthrie, George D ^a   Hickmott, Donald D ^a   Navrotsky, Alexandra ^c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Clathrasil; Compressibility; Melanophlogite; Pressure induced amorphization; Synchrotron X ray diffraction

Indexed keywords

AMORPHIZATION; COMPRESSIBILITY; CRYSTALLINITY; SILICON; SYNCHROTRON RADIATION; X RAY DIFFRACTION; ZEOLITES;

AMORPHIZATION PROCESS; CLATHRASILS; IN-SITU SYNCHROTRONS; MELANOPHLOGITE; PRESSURE AND TEMPERATURE; PRESSURE-INDUCED AMORPHIZATION; SYNCHROTRON X RAY DIFFRACTION; THERMODYNAMICALLY STABLE;

SILICA;

AMORPHOUS MEDIUM; COMPRESSIBILITY; CRYSTAL STRUCTURE; CRYSTALLINITY; POLYMORPHISM; PRESSURE EFFECT; SILICA MINERAL; TEMPERATURE EFFECT; THERMODYNAMICS; X-RAY DIFFRACTION;

EID: 33846454018     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2007.2195     Document Type: Article

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