Hardness ratio estimation in low counting X-ray photometry

Astrophysical Journal

Volumn 653, Issue 2 I, 2006, Pages 1566-1570

  Jin, Y K ^a   Zhang, S N ^a,b   Wu, J F ^a  

^a TSINGHUA UNIVERSITY   (China)

^b INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

Methods: statistical; X rays: general; X rays: ISM

Indexed keywords

EID: 33846373605     PISSN: 0004637X     EISSN: 15384357     Source Type: Journal    
DOI: 10.1086/508677     Document Type: Article

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