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Volumn 28, Issue 6, 2006, Pages 893-898
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Thermo-fatigue life prediction methodologies for SnAgCu solder joints in flip-chip assemblies
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Author keywords
Flip chip; Lead free; Life prediction; Solder joint; Thermo fatigue
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Indexed keywords
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EID: 33846363599
PISSN: 10019669
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (7)
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References (34)
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