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Volumn 571, Issue 1-2 SPEC. ISS., 2007, Pages 378-380

Digital filtering and analysis for a semiconductor X-ray detector data acquisition

Author keywords

Digital shaping; Pile up; Semiconductor detectors; X ray spectroscopy

Indexed keywords

AMPLIFIERS (ELECTRONIC); DATA REDUCTION; DIGITAL SIGNAL PROCESSING; PARAMETER ESTIMATION; PULSE WIDTH MODULATION; X RAY SPECTROSCOPY;

EID: 33846358854     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.10.113     Document Type: Article
Times cited : (42)

References (2)
  • 1
    • 33846349666 scopus 로고    scopus 로고
    • G.F. Knoll, Wiley, New York, 2000, 620pp.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.