Single-event transients in voltage regulators

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3455-3461

  Johnston, A H ^a,b   Miyahira, T F ^b   Irom, F ^b   Laird, J S ^b  

^a IEEE   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Radiation testing; Single event transient; Voltage regulator

Indexed keywords

RADIATION TESTING; SINGLE-EVENT TRANSIENTS; VOLTAGE REGULATOR CIRCUITS;

CAPACITANCE; COMPARATOR CIRCUITS; ELECTRIC LOADS; THERMAL EFFECTS;

VOLTAGE REGULATORS;

EID: 33846331987     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.886215     Document Type: Conference Paper

References (11)

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