Wavelet analysis of extended x-ray absorption fine structure data

Physica Scripta T

Volumn T115, Issue , 2005, Pages 232-234

  Funke, H ^a,b   Chukalina, M ^c   Rossberg, A ^a,b  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; FOURIER TRANSFORMS; SPECTRUM ANALYSIS; WAVELET ANALYSIS;

FINE STRUCTURE DATA; X-RAY ABSORPTION;

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

EID: 33846323416     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a00232     Document Type: Article

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