Cross-plan SiSiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics

Journal of Applied Physics

Volumn 101, Issue 1, 2007, Pages

  Ezzahri, Y ^a,b   Grauby, S ^a   Dilhaire, S ^a   Rampnoux, J M ^a   Claeys, W ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b University of California Santa Cruz   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC PROPERTIES; ACOUSTIC WAVE VELOCITY; NONDESTRUCTIVE EXAMINATION; SILICON COMPOUNDS; THERMAL CONDUCTIVITY; TRANSDUCERS; ULTRASONICS;

ELECTRON DIFFUSION; METAL TRANSDUCERS; PICOSECOND ULTRASONICS; THERMAL BOUNDARY RESISTANCE;

SEMICONDUCTOR SUPERLATTICES;

EID: 33846321879     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2403236     Document Type: Article

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