Low-cycle fatigue in silicon: Comparison with fcc metals

Fatigue and Fracture of Engineering Materials and Structures

Volumn 30, Issue 1, 2007, Pages 41-56

  George, Amand ^a   Jacques, A ^a   Legros, M ^a,b  

^a CNRS   (France)

^b CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; FATIGUE OF MATERIALS; FRICTION; HARDENING; SINGLE CRYSTALS; STRAIN; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY;

CYCLIC HARDENING; PLASTIC STRAIN; SILICON SINGLE CRYSTALS; TENSION-COMPRESSION;

SEMICONDUCTING SILICON;

EID: 33846288356     PISSN: 8756758X     EISSN: 14602695     Source Type: Journal    
DOI: 10.1111/j.1460-2695.2006.01075.x     Document Type: Article

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