Conductivity profile determination by eddy current for shot-peened superalloy surfaces toward residual stress assessment

Journal of Applied Physics

Volumn 101, Issue 1, 2007, Pages

  Shen, Y ^a,b   Lee, C ^a,c   Lo, C C H ^a   Nakagawa, N ^a   Frishman, A M ^a  

^a IOWA STATE UNIVERSITY   (United States)

^b Iowa State University   (United States)

^c OXFORD INSTRUMENTS PLASMA TECHNOLOGY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DATA INVERSION SOFTWARE; DEPTH PROFILES; SURFACE CONDUCTIVITY;

ENERGY DISPERSIVE SPECTROSCOPY; RESIDUAL STRESSES; SHOT PEENING; SUPERALLOYS; THERMAL CONDUCTIVITY; X RAY SPECTROGRAPHS;

EDDY CURRENTS;

EID: 33846288320     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2403970     Document Type: Article

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