-
1
-
-
33846274690
-
-
P. E. Dodd, Basic Mechanisms for Single-Event Effects, in Proc. IEEE NSREC Short Course, Section II, 1999.
-
P. E. Dodd, "Basic Mechanisms for Single-Event Effects," in Proc. IEEE NSREC Short Course, vol. Section II, 1999.
-
-
-
-
3
-
-
0023562593
-
The size effect of ion charge tracks on single event multiple-bit upset
-
R. C. Martin, N. M. Ghoniem, Y. Song, and J. S. Cable, "The size effect of ion charge tracks on single event multiple-bit upset," IEEE Trans. Nucl. Sci., vol. NS-34, pp. 1305-1309, 1987.
-
(1987)
IEEE Trans. Nucl. Sci
, vol.NS-34
, pp. 1305-1309
-
-
Martin, R.C.1
Ghoniem, N.M.2
Song, Y.3
Cable, J.S.4
-
4
-
-
0024169257
-
Charge collection in silicon for ions of different energy but same linear energy transfer (LET)
-
Dec
-
W. J. Stapor, P. T. McDonald, A. R. Knudson, A. B. Campbell, and B. G. Glagola, "Charge collection in silicon for ions of different energy but same linear energy transfer (LET)," IEEE Trans. Nucl. Sci., vol. 35, no. 6, pp. 1585-1590, Dec. 1988.
-
(1988)
IEEE Trans. Nucl. Sci
, vol.35
, Issue.6
, pp. 1585-1590
-
-
Stapor, W.J.1
McDonald, P.T.2
Knudson, A.R.3
Campbell, A.B.4
Glagola, B.G.5
-
5
-
-
0032313727
-
Impact of ion energy on single-event upset
-
Dec
-
P. E. Dodd, O. Musseau, M. R. Shaneyfelt, F. W. Sexton, C. D. Hose, G. L. Hash, M. Martinez, R. A. Loemker, J. L. Leray, and P. S. Winokur, "Impact of ion energy on single-event upset," IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2483-2491, Dec. 1998.
-
(1998)
IEEE Trans. Nucl. Sci
, vol.45
, Issue.6
, pp. 2483-2491
-
-
Dodd, P.E.1
Musseau, O.2
Shaneyfelt, M.R.3
Sexton, F.W.4
Hose, C.D.5
Hash, G.L.6
Martinez, M.7
Loemker, R.A.8
Leray, J.L.9
Winokur, P.S.10
-
6
-
-
0027807512
-
Single-event current transients induced by high energy ion microbeams
-
Dec
-
I. Nashiyama, T. Hirao, T. Kamiya, H. Yutoh, T. Nishijima, and H. Sekiguti, "Single-event current transients induced by high energy ion microbeams," IEEE Trans. Nucl. Sci., vol. 40, no. 6, pp. 1935-1940, Dec. 1993.
-
(1993)
IEEE Trans. Nucl. Sci
, vol.40
, Issue.6
, pp. 1935-1940
-
-
Nashiyama, I.1
Hirao, T.2
Kamiya, T.3
Yutoh, H.4
Nishijima, T.5
Sekiguti, H.6
-
7
-
-
0035388003
-
Development of a new data collection system and chamber for microbeam and laser investigations of single event phenomena
-
J. S. Laird, T. Hirao, H. Mori, S. Onoda, T. Kamiya, and H. Itoh, "Development of a new data collection system and chamber for microbeam and laser investigations of single event phenomena," Nucl. Instrum. Methods Phys. Res. B, vol. B181, pp. 87-94, 2001.
-
(2001)
Nucl. Instrum. Methods Phys. Res. B
, vol.B181
, pp. 87-94
-
-
Laird, J.S.1
Hirao, T.2
Mori, H.3
Onoda, S.4
Kamiya, T.5
Itoh, H.6
-
8
-
-
0032305831
-
Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics
-
Dec
-
H. Schone, D. S. Walsh, F. W. Sexton, B. L. Doyle, P. E. Dodd, J. F. Aurand, R. S. Flores, and N. Wing, "Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics," IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2544-2549, Dec. 1998.
-
(1998)
IEEE Trans. Nucl. Sci
, vol.45
, Issue.6
, pp. 2544-2549
-
-
Schone, H.1
Walsh, D.S.2
Sexton, F.W.3
Doyle, B.L.4
Dodd, P.E.5
Aurand, J.F.6
Flores, R.S.7
Wing, N.8
-
9
-
-
0023534153
-
Transient measurements of ultrafast charge collection in semiconductor diodes
-
Dec
-
R. S. Wagner, J. M. Bradley, N. Bordes, C. J. Maggiore, D. N. Sinha, and R. B. Hammond, "Transient measurements of ultrafast charge collection in semiconductor diodes," IEEE Trans. Nucl. Sci., vol. NS-34, no. 6, pp. 1240-1245, Dec. 1987.
-
(1987)
IEEE Trans. Nucl. Sci
, vol.NS-34
, Issue.6
, pp. 1240-1245
-
-
Wagner, R.S.1
Bradley, J.M.2
Bordes, N.3
Maggiore, C.J.4
Sinha, D.N.5
Hammond, R.B.6
-
10
-
-
0031548966
-
Recent progress in JAERI single ion hit system
-
T. Sakai, T. Hamano, T. Suda, T. Hirao, and T. Kamiya, "Recent progress in JAERI single ion hit system," Nucl. Instrum. Methods Phys. Res. B, vol. B130, pp. 498-502, 1997.
-
(1997)
Nucl. Instrum. Methods Phys. Res. B
, vol.B130
, pp. 498-502
-
-
Sakai, T.1
Hamano, T.2
Suda, T.3
Hirao, T.4
Kamiya, T.5
-
11
-
-
0031549014
-
Accuracy of beam positioning in TIARA
-
T. Kamiya, T. Sakai, T. Hamano, T. Suda, and T. Hirao, "Accuracy of beam positioning in TIARA," Nucl. Instrum. Methods Phys. Res. B, vol. B130, pp. 285-288, 1997.
-
(1997)
Nucl. Instrum. Methods Phys. Res. B
, vol.B130
, pp. 285-288
-
-
Kamiya, T.1
Sakai, T.2
Hamano, T.3
Suda, T.4
Hirao, T.5
-
12
-
-
0031549051
-
Developement of high-resokution single-ion PSD using random access memories
-
T. Hamano, M. Takebe, T. Hirao, I. Nashiyama, T. Kamiya, T. Suda, and T. Sakai, "Developement of high-resokution single-ion PSD using random access memories," Nucl. Instrum. Methods Phys. Res. B, vol. B130, pp. 280-284, 1997.
-
(1997)
Nucl. Instrum. Methods Phys. Res. B
, vol.B130
, pp. 280-284
-
-
Hamano, T.1
Takebe, M.2
Hirao, T.3
Nashiyama, I.4
Kamiya, T.5
Suda, T.6
Sakai, T.7
-
13
-
-
36049055816
-
Energy Deposition by Electron Beams and delta Rays
-
Jun. 10
-
E. J. Kobetich and R. Katz, "Energy Deposition by Electron Beams and delta Rays," Phys. Rev., vol. 170, pp. 391-396, Jun. 10, 1968.
-
(1968)
Phys. Rev
, vol.170
, pp. 391-396
-
-
Kobetich, E.J.1
Katz, R.2
-
14
-
-
0000854030
-
Distribution of radial energy deposition around the track of energetic charged particles in silicon
-
Mar. 1
-
O. Fageeha, J. Howard, and R. C. Block, "Distribution of radial energy deposition around the track of energetic charged particles in silicon," J. Appl. Phys., vol. 75, pp. 2317-2321, Mar. 1, 1994.
-
(1994)
J. Appl. Phys
, vol.75
, pp. 2317-2321
-
-
Fageeha, O.1
Howard, J.2
Block, R.C.3
-
15
-
-
0036624507
-
Temperature dependence of heavy ion-induced current transients in Si epilayer devices
-
Jun
-
J. S. Laird, T. Hirao, S. Onoda, H. Mori, and H. Itoh, "Temperature dependence of heavy ion-induced current transients in Si epilayer devices," IEEE Trans. Nucl. Sci., vol. 49, no. 3, pp. 1389-1395, Jun. 2002.
-
(2002)
IEEE Trans. Nucl. Sci
, vol.49
, Issue.3
, pp. 1389-1395
-
-
Laird, J.S.1
Hirao, T.2
Onoda, S.3
Mori, H.4
Itoh, H.5
-
16
-
-
22944483477
-
High-injection carrier dynamics generated by MeV heavy ions impacting high-speed photodetectors
-
J. S. Laird, T. Hirao, S. Onoda, and H. Itoh, "High-injection carrier dynamics generated by MeV heavy ions impacting high-speed photodetectors," J. Appl. Phys., vol. 98, pp. 013530-14, 2005.
-
(2005)
J. Appl. Phys
, vol.98
, pp. 013530-013514
-
-
Laird, J.S.1
Hirao, T.2
Onoda, S.3
Itoh, H.4
-
17
-
-
0038823592
-
TCAD modeling of single MeV ion induced charge collection processes in Si devices
-
J. S. Laird, T. Hirao, S. Onoda, H. Mori, and H. Itoh, "TCAD modeling of single MeV ion induced charge collection processes in Si devices," Nucl. Instrum. Methods Phys. Res. B, vol. 206, pp. 36-41, 2003.
-
(2003)
Nucl. Instrum. Methods Phys. Res. B
, vol.206
, pp. 36-41
-
-
Laird, J.S.1
Hirao, T.2
Onoda, S.3
Mori, H.4
Itoh, H.5
-
18
-
-
0031167885
-
Charge collection from ion tracks in simple EPI diodes
-
Jun
-
L. D. Edmonds, "Charge collection from ion tracks in simple EPI diodes," IEEE Trans. Nucl. Sci., vol. 44, no. 3, pp. 1448-1456, Jun. 1997.
-
(1997)
IEEE Trans. Nucl. Sci
, vol.44
, Issue.3
, pp. 1448-1456
-
-
Edmonds, L.D.1
-
19
-
-
0043015781
-
Design of a focusing high-energy heavy ion micorbeam system at the JAERI AVF Cyclotron
-
M. Oikawa, T. Kamiya, M. Fukuda, S. Okumura, H. Inoue, S. Masuno, S. Umemiya, Y. Oshiyama, and Y. Taira, "Design of a focusing high-energy heavy ion micorbeam system at the JAERI AVF Cyclotron," Nucl. Instrum. Methods Phys. Res. B, vol. B210, pp. 54-58, 2003.
-
(2003)
Nucl. Instrum. Methods Phys. Res. B
, vol.B210
, pp. 54-58
-
-
Oikawa, M.1
Kamiya, T.2
Fukuda, M.3
Okumura, S.4
Inoue, H.5
Masuno, S.6
Umemiya, S.7
Oshiyama, Y.8
Taira, Y.9
-
20
-
-
33846314083
-
Improvement in beam quality of the JAEA AVF cyclotron for focusing heavy-ion beam with energy of hundreds of MeV
-
Singapore
-
S. Kurashima, N. Miyawaki, T. Kamiya, M. Oikawa, K. Yoshida, M. Fukuda, S. Okumura, T. Satoh, T. Nara, T. Agematsu, I. Ishibori, W. Yokota, and Y. Nakamura, "Improvement in beam quality of the JAEA AVF cyclotron for focusing heavy-ion beam with energy of hundreds of MeV," in Proc. 10th Int. Conf. Nuclear Microprobe Technology and Applications, Singapore, 2006.
-
(2006)
Proc. 10th Int. Conf. Nuclear Microprobe Technology and Applications
-
-
Kurashima, S.1
Miyawaki, N.2
Kamiya, T.3
Oikawa, M.4
Yoshida, K.5
Fukuda, M.6
Okumura, S.7
Satoh, T.8
Nara, T.9
Agematsu, T.10
Ishibori, I.11
Yokota, W.12
Nakamura, Y.13
-
21
-
-
33846329562
-
Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron
-
Singapore
-
M. Oikawa, T. Satoh, T. Sakai, N. Miyawaki, H. Kashiwagi, S. Kurashima, S. Okumura, M. Fukuda, W. Yokota, and T. Kamiya, "Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron," in Proc. 10th Int. Conf. Nuclear Microprobe Technology and Applications, Singapore, 2006.
-
(2006)
Proc. 10th Int. Conf. Nuclear Microprobe Technology and Applications
-
-
Oikawa, M.1
Satoh, T.2
Sakai, T.3
Miyawaki, N.4
Kashiwagi, H.5
Kurashima, S.6
Okumura, S.7
Fukuda, M.8
Yokota, W.9
Kamiya, T.10
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